# this file is part of refractiveindex.info database
# refractiveindex.info database is in the public domain
# copyright and related rights waived via CC0 1.0
REFERENCES: |
G. E. Jellison Jr., T. E. Haynes, H. H. Burke.
Optical functions of silicon-germanium alloys determined using spectroscopic ellipsometry.
Opt. Mat. 2, 105-117 (1993)
COMMENTS: |
SixGe1-x, x = 0.85. 7-μm film grown on Si substrate.
DATA:
- type: tabulated nk
data: |
0.240 1.649 3.404
0.242 1.659 3.446
0.244 1.664 3.491
0.246 1.672 3.542
0.248 1.683 3.596
0.250 1.712 3.657
0.252 1.740 3.724
0.254 1.756 3.818
0.256 1.787 3.879
0.258 1.823 3.964
0.260 1.864 4.060
0.262 1.918 4.164
0.264 1.966 4.255
0.266 2.037 4.367
0.268 2.119 4.487
0.270 2.213 4.602
0.272 2.334 4.731
0.274 2.496 4.856
0.276 2.654 4.969
0.278 2.843 5.063
0.280 3.066 5.149
0.282 3.302 5.212
0.284 3.561 5.236
0.286 3.840 5.221
0.288 4.161 5.145
0.290 4.422 4.989
0.292 4.622 4.794
0.294 4.758 4.587
0.296 4.871 4.383
0.298 4.917 4.198
0.300 4.950 4.038
0.304 4.980 3.777
0.308 4.977 3.582
0.312 4.976 3.432
0.316 4.988 3.314
0.320 5.002 3.212
0.324 5.028 3.122
0.328 5.053 3.043
0.332 5.085 2.977
0.336 5.126 2.914
0.340 5.161 2.864
0.344 5.207 2.811
0.348 5.260 2.777
0.352 5.331 2.738
0.356 5.422 2.700
0.360 5.538 2.655
0.364 5.670 2.598
0.368 5.828 2.503
0.372 5.997 2.349
0.376 6.146 2.140
0.380 6.234 1.874
0.384 6.255 1.597
0.388 6.226 1.355
0.392 6.157 1.135
0.396 6.063 0.941
0.400 5.954 0.783
0.404 5.842 0.651
0.408 5.725 0.547
0.412 5.611 0.467
0.416 5.512 0.403
0.420 5.418 0.351
0.430 5.186 0.255
0.440 5.029 0.206
0.450 4.893 0.165
0.460 4.772 0.142
0.470 4.681 0.122
0.480 4.595 0.098
0.490 4.516 0.083
0.500 4.452 0.070
0.510 4.390 0.053
0.520 4.332 0.044
0.530 4.279 0.038
0.540 4.239 0.039
0.550 4.209 0.034
0.560 4.170 0.027
0.570 4.136 0.027
0.580 4.101 0.023
0.590 4.076 0.021
0.600 4.045 0.018
0.610 4.021 0.020
0.620 4.004 0.013
0.630 3.977 0.016
0.640 3.969 0.010
0.650 3.941 0.004
0.660 3.921 0.004
0.670 3.904 0.003
0.680 3.891 0.007
0.690 3.876 0.000
0.700 3.857 0.003
0.710 3.846 0.009
0.720 3.832 0.013
0.730 3.831 0.009
0.740 3.816 0.009
0.750 3.803 0.010
0.760 3.793 0.011
0.770 3.784 0.009
0.780 3.779 0.010
0.790 3.772 0.008
0.800 3.764 0.010
0.810 3.759 0.008
0.820 3.753 0.009
0.830 3.752 0.007
0.840 3.750 0.004
CONDITIONS:
x: 0.85
thickness: 7 μm
substrate: Si